Loss caused by inhomogeneous refractive index of optical fiber material
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Optical fiberLoss caused by non-uniform refractive index of materials.
In the process, forEtchingProcess, uniformity is a parameter that measures the etching ability of the etching process on the whole wafer, or the whole batch, or between batches.For the coating process, uniformity is a parameter used to measure whether the coating thickness is consistent.NU%=（Emax—Emin）/Eave
Chinese name
Uneven
Properties
terms
Interpretation
Optical fiberLoss caused by inhomogeneous refractive index of materials
