New arrival

2024/04/16

• Automated SEM imaging and measurement of resist line patterns

2024/04/16

• Elemental mapping of 3D NAND device multi-layered structure by EFTEM

2024/04/16

• CSI-AFM linked surface configuration measurement of defective pillar pattern …

2024/04/16

• Enhancement of dopant contrast by energy-selective detection of secondary …

2024/04/16

• High-throughput sample preparation by Flat-milling for cross-section …

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News release

2023/09/06

• Hitachi High-Tech Group Introduces NEXTA®DMA200 Thermal Analyzer with High Forc

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