Preparation of JJF 2060-2023 Sub micron and Nanometer Particle Size Reference Materials
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This specification specifies the requirements for selection and subpackaging, uniformity assessment, stability assessment, fixed value and uncertainty assessment, packaging and storage, development report and certificate of sub micron and nano particle (spherical particle) size reference material candidates. This specification is applicable to the development of submicron and nanometer particle size reference materials with electronic microscopic imaging technology and atomic force microscopic imaging technology, and can also provide reference for the development of other particle size reference materials.
