Introduction to Ieee Geoscience And Remote Sensing Letters
Ieee Geoscience And Remote Sensing Letters is a professional academic journal in the field of engineering technology sponsored by the publisher of IEEE-INST ELECTRIC ELECTRONICS ENGINEERING INC. Since its inception in 2004, it has always won the respect of the industry with high-quality content. The journal has an official serial number (ISSN: 1545-598X, E-ISSN:1558-0571), Publication cycle: Quarterly, whose publishing area is located in UNITED STATES. The core mission of the journal is to promote the exchange of educational research and practical experience in engineering technology and geochemical and geophysical fields, publish innovative academic papers of peers, advocate academic contention, stimulate academic innovation, carry out international academic exchanges, and inject vitality into the development of engineering technology.
The self citation rate of articles in this journal is 0.0738..., the proportion of open source content is 0.0069, the proportion of publication withdrawal is 0, and the proportion of OA being cited is 0. The reader group mainly includes engineering technology professionals, graduate students, undergraduate students, and engineering technology enthusiasts. These reader groups come from all over the world, with a wide range of academic backgrounds and interests. Ieee Geoscience And Remote Sensing Letters has been included in the international authoritative academic database "SCI (Science Citation Index), SCIE (Science Citation Index Expanded)", which facilitates the retrieval and reference of scholars and researchers around the world, and helps promote research progress and innovative development in the field of geochemistry and geophysics.
CiteScore
- CiteScore:6.40
- SJR:1.284
- SNIP:2.356
Discipline category |
partition |
ranking |
Percentile |
Category: Earth and Planetary Sciences
Subclass: Geotechnical Engineering and Engineering Geology
|
Q1
|
43 / 211
|
|
Category: Earth and Planetary Sciences
Category: Electrical and Electronic Engineering
|
Q1
|
160 / 738
|
|
CiteScore This innovative indicator strives to provide a more comprehensive and accurate journal evaluation, breaking the limitation of relying only on a single indicator such as impact factors in the past. It has ensured greater transparency and openness by integrating a wide range of quoted data across multiple disciplines. As an important part of a series of journal indicators in Scopus, it includes SNIP (impact of source document standardization), SJR (SCImage magazine ranking), cited document count and quoted percentage. Scopus integrates the above indicators to help researchers deeply understand the citation of more than 22220 kinds of treatises. You can learn the details of each indicator on the Scopus Joumal Metrics website.
CiteScore partition value and impact factor value data comparison
Ieee Geoscience And Remote Sensing Letters
Division of Chinese Academy of Sciences December 2022 Upgrade
Major disciplines |
partition |
Sub discipline |
partition |
Top Journals |
Review journal |
Engineering technology |
Zone 2 |
GEOCHEMISTRY & GEOPHYSICS
Geochemistry and geophysics
IMAGING SCIENCE & PHOTOGRAPHIC TECHNOLOGY
Imaging Science and Photography Technology
ENGINEERING, ELECTRICAL & ELECTRONIC
Engineering: Electronics and Electrical
REMOTE SENSING
remote sensing
|
Zone 2
Zone 2
Zone 3
Zone 3
|
yes |
yes |
Division of Chinese Academy of Sciences December 2021 Basic Edition
Major disciplines |
partition |
Sub discipline |
partition |
Top Journals |
Review journal |
Engineering technology |
Zone 3 |
ENGINEERING, ELECTRICAL & ELECTRONIC
Engineering: Electronics and Electrical
GEOCHEMISTRY & GEOPHYSICS
Geochemistry and geophysics
IMAGING SCIENCE & PHOTOGRAPHIC TECHNOLOGY
Imaging Science and Photography Technology
REMOTE SENSING
remote sensing
|
Zone 3
Zone 2
Zone 3
Zone 3
|
yes |
yes |
Division of Chinese Academy of Sciences December 2021 Upgrade
Major disciplines |
partition |
Sub discipline |
partition |
Top Journals |
Review journal |
Engineering technology |
Zone 2 |
IMAGING SCIENCE & PHOTOGRAPHIC TECHNOLOGY
Imaging Science and Photography Technology
ENGINEERING, ELECTRICAL & ELECTRONIC
Engineering: Electronics and Electrical
GEOCHEMISTRY & GEOPHYSICS
Geochemistry and geophysics
REMOTE SENSING
remote sensing
|
Zone 2
Zone 3
Zone 3
Zone 3
|
yes |
yes |
Division of Chinese Academy of Sciences Old upgraded version in December 2020
Major disciplines |
partition |
Sub discipline |
partition |
Top Journals |
Review journal |
Engineering technology |
Zone 2 |
ENGINEERING, ELECTRICAL & ELECTRONIC
Engineering: Electronics and Electrical
GEOCHEMISTRY & GEOPHYSICS
Geochemistry and geophysics
IMAGING SCIENCE & PHOTOGRAPHIC TECHNOLOGY
Imaging Science and Photography Technology
REMOTE SENSING
remote sensing
|
Zone 3
Zone 3
Zone 3
Zone 3
|
yes |
yes |
Distribution trend of CAS zoning table over the years
JCR partition of WOS journals
JCR partition level |
JCR discipline |
partition |
Q2 |
ENGINEERING, ELECTRICAL & ELECTRONIC |
Q2 |
GEOCHEMISTRY & GEOPHYSICS |
Q1 |
IMAGING SCIENCE & PHOTOGRAPHIC TECHNOLOGY |
Q2 |
REMOTE SENSING |
Q2 |
JCR (Journal Citation Reports) partition, also known as JCR journal partition, is an internationally common and recognized journal partition standard developed by Thomson Reuters (now part of Kerui Weian). JCR partition is based on the SCI database, sorted according to the impact factors of journals, and divided into four areas in a similar way: Q1, Q2, Q3 and Q4. It should be noted that the standard of JCR partition is different from that of JCR journal partition (also called partition table and partition data) of the Chinese Academy of Sciences. For example, the number of divisions of the two is different. The JCR is divided into four districts, while the Chinese Academy of Sciences is divided into 176 disciplines. Each discipline is divided into four districts according to the level of impact factors. In addition, there are differences in the range of influence factors between the two.
Document data over the years
particular year |
Annual number of documents issued |
Number of articles |
Summary quantity |
two thousand and twenty |
four hundred and twenty-five |
four hundred and twenty-five |
zero |
two thousand and nineteen |
three hundred and eighty-five |
three hundred and eighty-five |
zero |
two thousand and eighteen |
three hundred and eighty-two |
three hundred and eighty-two |
zero |
two thousand and seventeen |
four hundred and ninety-two |
four hundred and ninety-two |
zero |
two thousand and sixteen |
four hundred and six |
four hundred and six |
zero |
two thousand and fifteen |
four hundred and ninety-nine |
four hundred and ninety-nine |
zero |
Journal citation relationship
Cited by other journals |
Journal name |
Number of references |
REMOTE SENS-BASEL |
two thousand and thirty-five |
IEEE T GEOSCI REMOTE |
one thousand five hundred and sixty-eight |
IEEE ACCESS |
nine hundred and forty |
IEEE J-STARS |
seven hundred and fourteen |
IEEE GEOSCI REMOTE S |
six hundred and sixty-one |
SENSORS-BASEL |
four hundred and nineteen |
INT J REMOTE SENS |
three hundred and seventy-eight |
REMOTE SENS ENVIRON |
two hundred and sixty-four |
ISPRS J PHOTOGRAMM |
two hundred and sixty-three |
J APPL REMOTE SENS |
two hundred and forty |
Quote other publications |
Journal name |
Number of references |
IEEE T GEOSCI REMOTE |
one thousand one hundred and eighty-eight |
IEEE GEOSCI REMOTE S |
six hundred and sixty-one |
IEEE J-STARS |
two hundred and twenty-seven |
GEOPHYSICS |
one hundred and seventy-four |
REMOTE SENS-BASEL |
one hundred and fifty-nine |
REMOTE SENS ENVIRON |
one hundred and forty-one |
IEEE T IMAGE PROCESS |
one hundred and thirty-one |
ISPRS J PHOTOGRAMM |
one hundred and nineteen |
IEEE T PATTERN ANAL |
one hundred and twelve |
IEEE T AERO ELEC SYS |
eighty-nine |